For past several decades, the processor industry has enjoyed the benefits of chip miniaturization and the exponential increase in the number of on-chip transistors as predicted by Moore's law. However ...

SE: Especially with advanced nodes, there are many types of variation in the process and today’s design and verification tools have to understand this. How does variation impact the sphere of your ...

The economics for random variation are changing, particularly at advanced nodes and in complex packaging schemes. Random variation always will exist in semiconductor manufacturing processes, but much ...

In this, the fifth instalment of the "Let's Talk PVT Monitoring" series I chat with Oliver King about monitoring in-chip conditions in modern SoCs and this time we discuss process detection and ...

Plotting process data is an important and necessary step in understanding process variation. Both simple and complex techniques can be used. In this chapter, we discuss two techniques for analyzing ...

Ring-oscillator process monitors give production test teams a fast on-die frequency measurement for identifying CMOS process variation and sorting dies at wafer level. A process monitor is a dedicated ...